Rising Edge and High Level by PCI-MIO-16E-4

[Gino]

I am using ADXL202AE (analog device accelerometer) wired to SC-2043 SG and PCI-MIO-16E-4. The accelerometer provides PWM signal to COUNT/Timer.
I found some examples of LabVIEW to measure the pulse width. My question is how to use (or measure) both of Rising Edge and High level in gate parameters (gate mode). The parameter is shown in Meas Buffered Pulse-Period (DAQ-STC).vi

For easy understanding, PWM signal shows the following:
' <------ Period (T2)----->
' +--------+ +----
' | | |
' ---+ +------------+
' <--T1-->

I need to measure T1 and T2 simultaneously. However, by using "Meas Buffered Pulse-Period (DAQ-STC).vi," two value was unable to be obtained beca
use of "-10016 Error at CTR buffer read."

I will appreciate if anybody let me know how to manage this problem.

Regards,
GINO

[Spencer S.]

Gino,

If I understand your application correctly, you will want to perform a buffered semi-period measurement. With a buffered semi-period measurement, both the high pulse-widths and low pulse-widths are measured and buffered. It appears that you are interested in both the high pulse-widths and the periods of the signal. To obtain the periods, you will need to add each corresponding high pulse-width and low pulse-width. I would suggest that you examine the following example:

Examples >> Hardware Input and Output >> Traditional DAQ >> Counters >> DAQ-STC >> Measure Buffered Semi Period (DAQ-STC).vi

Good luck with your application.

Spencer S.