05-21-2008 03:03 PM
05-22-2008 10:52 AM
Hi jgdub,
Assuming that you're talking about the usual IEEE denormals (and there are many of them) for NaN, +INF, -INF, then DIAdem maps all of these values to one IEEE denormal value in DIAdem which it displays and processes as DIAdem NoValues. If you then save the data from DIAdem back to a data file, you get only NaN denormals, so you lose the +INF or -INF distinctions, if there were any.
Inside of DIAdem NoValues are handled comprehensively, flexibly and sensibly in graphing and analysis. Were there any particular steps inside DIAdem you were curious about?
Brad Turpin
DIAdem Product Support Engineer
National Instruments
05-22-2008 03:09 PM
Hi Brad,
I recently saw a demo of DIAdem and was quite impressed.
I work with data sets were missing data is represented by NaN (ie data were the instrument was offline), data over the upper detection limit is represented by +INF and data below the lower detection limit is represented by -INF. From what I saw the NaNs are handled as you say "comprehensively, flexibly and sensibly" but from your description the INFs are essentially ignored. I was hoping for something different in the way you handle INFs. I'm certain that I can find a workaround but it would be simpler for the INFs to be retained in the data sets and handled in calculations. Any chance for this to be implemented?
jgdub
05-23-2008 09:23 AM
05-29-2008 01:53 PM
05-29-2008 01:53 PM
05-29-2008 01:53 PM
05-29-2008 01:53 PM
05-29-2008 01:53 PM
05-29-2008 01:53 PM