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06-18-2012 01:02 PM
Hello,
I too am interested in removing the pull-up resistor for testing purposes. I am finding this so frustrating that there is no way around this pull-up configuration. I wish to test one of my company board's digital outputs using the NI digital Input on a 6008/9 or 6501 device.
However, How can I ever test my UUT's output when high if the Digital input is pulled high? And the solution of inverting the input solves nothing. It just is changing the perspective, not the physical hardware.
If you can give me the actual pull-up resistor numbers it would be greatly appreciated.
thanks,
Daivd
06-19-2012 05:26 PM - edited 06-19-2012 05:28 PM
Hi David,
Here is a paragraph from the NI 6501 User Manual that explains how to determine the maximum value of the external pull-up resistor:
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The default configuration of the NI USB-6501 DIO ports is open collector,
allowing 5 V operation, with an onboard 4.7 kΩ pull-up resistor. An
external, user-provided pull-up resistor can be added to increase the source
current drive up to a 8.5 mA limit per line, as shown in Figure 6.
Figure 6. Example of Connecting External User-Provided Resistor
Complete the following steps to determine the value of the user-provided
pull-up resistor:
1. Place an ammeter in series with the load.
2. Place a variable resistor between the digital output line and the +5 V.
3. Adjust the variable resistor until the ammeter current reads as the
intended current. The intended current must be less than 8.5 mA.
4. Remove the ammeter and variable resistor from your circuit.
5. Measure the resistance of the variable resistor. The measured
resistance is the ideal value of the pull-up resistor.
6. Select a static resistor value for your pull-up resistor that is greater than
or equal to the ideal resistance.
7. Re-connect the load circuit and the pull-up resistor.
Additionally, you can configure the NI USB-6501 DIO ports as active
drive. When configured as active drive, the total current sourced by all
DO lines simultaneously should not exceed 65 mA.
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