Eric Starkloff, NI director of Product Marketing for Modular Instrumentation and Instrument Control, discusses the changes impacting instrumentation and automated test and how National Instruments LabVIEW, multicore processors and field-programmable gate array (FPGA) technologies are driving the next generation of test.
Click below to read the full Q&A.
http://zone.ni.com/devzone/cda/tut/p/id/10988?metc=mtkk3i
