(sorry, the previous post got messed up)
I'm new to the world of "Automated Test" and
ATE's, so i'm looking for some input. We have an older ATE in house that we
would like to upgrade with a PXI chassis. I'm not involved yet with the details
of the hardware; this question instead pertains to software.
Most of our ATE tests produce single data values. An
example would be:
-Record Resistance
-Run Electrical test on part; record voltage and current
-Record Resistance after test
I've done a little bit of looking, and it seems that the
industry standard for saving test data is with the TDMS file format. Currently,
we are building an internal SCADA system of our cRIO-based manufacturing
equipment around the DSC Module and the Citadel database, so data collection is
on my mind (so to speak). We are also planning on using DIAdem for engineers to
analyze data/post process.
My question is, what are the pros/cons of using the TDMS
based method of data recording vs. the Pros/Cons of using the Citadel Database
(and shared variables) to record data from test runs?
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--CLD--
LV 6.1 to 2015 SP1
