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Dynamically identify ID skip measured and write log

Hi all,

 

I want to measure four DUTs on a PCBA board, standard log is measured from A to D five times and write test log,but if someone out of range first time write actual value in log file second time measured from A,C,D,write log need add Nan at B position row instead.

 

Measured_Screenshot.pngLog_Screenshot.png

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Message 1 of 9
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In Simple you can read all the values and during data analysis you can replace the value of B with Nan once it encounters failure once.

 

If you have concern in reading all the data even if its fails, You can maintain a State of failure mode and decide accordingly.

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Palanivel Thiruvenkadam | பழனிவேல் திருவெங்கடம்
LabVIEW™ Champion |Certified LabVIEW™ Architect |Certified TestStand Developer

Kidlin's Law -If you can write the problem down clearly then the matter is half solved.
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Message 2 of 9
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Thanks for your reply. Maybe I didn't explain it clearly.

 

The normal logic is:

1)Put on Position A press button start measure and write data to log file.

2)Put on Position B press button start measure and write data to log file.

3)Put on Position C press button start measure and write data to log file.

4)Put on Postion D press button start measure and write data to log file.

Five times measurement and write test value and Positon, Cycle time to log file.

 

The failed logic is:

First:

1)Put on Position A press button start measure and write data to log file.

2)Put on Position B press button start measure and write data to log file.--->out of range

3)Put on Position C press button start measure and write data to log file.

4)Put on Postion D press button start measure and write data to log file.

Second:

1)Put on Position A press button start measure and write data to log file.

2)Skip measured only write data to log file.--->How to remain the position without measurement and write Nan value there, while A DUT measured and measured C DUT.

3)Put on Position C press button start measure and write data to log file.

4)Put on Postion D press button start measure and write data to log file.

Third:
1)Put on Position A press button start measure and write data to log file.

2)Skip measured only write data to log file.--->How to remain the position without measurement and write Nan value there, while A DUT measured and measured C DUT.

3)Put on Position C press button start measure and write data to log file.

4)Put on Postion D press button start measure and write data to log file.

Fourth:
1)Put on Position A press button start measure and write data to log file.

2)Skip measured only write data to log file.--->How to remain the position without measurement and write Nan value there, while A DUT measured and measured C DUT.

3)Put on Position C press button start measure and write data to log file.

4)Put on Postion D press button start measure and write data to log file.

Fifth:
1)Put on Position A press button start measure and write data to log file.

2)Skip measured only write data to log file.--->How to remain the position without measurement and write Nan value there, while A DUT measured and measured C DUT.

3)Put on Position C press button start measure and write data to log file.

4)Put on Postion D press button start measure and write data to log file.

Five times measurement and write test value and Positon, Cycle time to log file.

 

SamHuang_0-1681310160781.png

 

 

 

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Message 3 of 9
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Hi all.

Measurement four DUTs on PCBA, each one press button to start and write log file.

I really appreciated your replied, Maybe I didn't express clear.

 

The normal logic is :

1)Put on A start measure and write test data.

2)Put on B start measure and write test data.

3)Put on C start measure and write test data.

4)Put on D start measure and write test data.

And cycle five times measured and write test data as screenshots.

 

The failure logic is :

First :

1)Put on A start measure and write test data.

2)Put on B start measure and write test data.--->out of range.

3)Put on C start measure and write test data.

4)Put on D start measure and write test data.

 

Second:

1)Put on A start measure and write test data.

2)skip measure only write test data directly.(How to handle this add Nan and position and cycle value when A measured finished and start C measured)

3)Put on C start measure and write test data.

4)Put on D start measure and write test data.

 

Third:

Second:

1)Put on A start measure and write test data.

2)skip measure only write test data directly.

3)Put on C start measure and write test data.

4)Put on D start measure and write test data.

 

Fourth:

Second:

1)Put on A start measure and write test data.

2)skip measure only write test data directly.

3)Put on C start measure and write test data.

4)Put on D start measure and write test data.

 

Fifth:

1)Put on A start measure and write test data.

2)skip measure only write test data directly.

3)Put on C start measure and write test data.

4)Put on D start measure and write test data.

 

And cycle five times measured and write test data as screenshots.

 

SamHuang_0-1681346613974.png

 

SamHuang_1-1681346696640.png

 

SamHuang_2-1681346783940.png

 

 

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Message 4 of 9
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Please do not duplicate posts, continue all your discussions in the same thread.

 

https://forums.ni.com/t5/LabVIEW/Dynamically-identify-ID-skip-measured-and-write-log/m-p/4297313

Santhosh
Soliton Technologies

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Message 5 of 9
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Thanks.

I don't know that can't add anymore content in that thread, as create a new one.

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Message 6 of 9
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Sorry to bother all of you, but I still not find out an excellent way to handle this.

 

Could someone help me with this?

 

I tried to add an array of boolean to recode measured A,B,C,D result,first cycle is ok and the second cycle logic is wrong.

 

The code's purpose is measurement four DUTs of PCBA with five cycles.

when a dut first-time failure writes to the log file, the second-time skip-measured action only writes Nan in log file.

 

 

SamHuang_0-1682259855131.png

 

 

 

 

 

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Message 7 of 9
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@Sam.Huang wrote:

Sorry to bother all of you, but I still not find out an excellent way to handle this.

 

Could someone help me with this?

 

I tried to add an array of boolean to recode measured A,B,C,D result,first cycle is ok and the second cycle logic is wrong.

 

The code's purpose is measurement four DUTs of PCBA with five cycles.

when a dut first-time failure writes to the log file, the second-time skip-measured action only writes Nan in log file.

 

 

SamHuang_0-1682259855131.png

 

 

 

 

 


Modified your code with Event Handler and Cluster for Data Handling (you have to Make cluster data as typedef) and Position Increment Case Changed for Reporting Purpose.

Limit Data Added (Different Value for different Position.

Currently the modified application will measure all four data all the time. but update NaN when the position=1 and Result=Fail.

 

I want you to try the skip measurement option from your end, so that is still not implemented.

 

 

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Palanivel Thiruvenkadam | பழனிவேல் திருவெங்கடம்
LabVIEW™ Champion |Certified LabVIEW™ Architect |Certified TestStand Developer

Kidlin's Law -If you can write the problem down clearly then the matter is half solved.
-----------------------------------------------------------------------------------------------------------------
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Message 8 of 9
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Thank you so much for your input. I still try to modify what I want to code.

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Message 9 of 9
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