05-14-2024 09:50 AM - edited 05-14-2024 09:54 AM
Hello,
i have the code attached. I want to increase the number of samples that can be measured in a single run from 30000 (what i think is the memory of the device) to whatever (like 100000 or more). The number of samples can be specified by the control accumulate.
i found that fetching can help but dont know how to implement such thing, or if you know other solution.
many thanks in advance.
05-14-2024 10:11 AM
Well you only have so much memory on the device.
So you will need to shorten the record length when using higher sample rates
05-14-2024 10:40 AM
But that is exactly the problem i'm trying to solve. people proposed fetching as far as I understood, but no idea how to use it.