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Yes, but the timing was set before the read vi. So the settings are already saved to the DAQ task even before the read has begun. So the read would then rely on the timing settings of the task. You can use the timing vi on the count events example although take note that the timing vi checks for change detection of the digital i/o and not the counter i/o.
@tadk wrote:
I am confused then, because in the 'change-chan' example, the timeout is obviously controlled by the read vi, not the timing vi.
could I add the timing vi to the count-events example?
You got it on the other way around. The "change-chan" uses an edge-triggered device which was set on the timing vi. The "count-events" continuously take samples. As you can see, when you run the vi and there's no edges, the value read are always zero. When there are edges found, the number of edges will be stored on DAQ memory. The read vi on "count-events" would then read the number of edges found on the DAQ memory
@tadk wrote:
At some level I know that in order to detect an edge, you either continously take samples comparing every two successive
ones for change, or you can use an edge-triggered device. I suspect the 'change-chan' uses the first method, I don't know
what the 'count-events' uses, but I would guess the second method.
In your project, it seems that it is better to use the "change-chan" example as your reference. Although there seems to be a problem with your DMM with a very slow set-up time.
@tadk wrote:
I see a bigger problem for me. The big picture is I want to wait for a falling edge, delay 300ms, and then measure an analog
voltage. I was planning to use a mux-dmm examples I have found to do the actual measurement. Because I am using Teststand,
I had a step that senses the falling edge, a step that delays, and a step that measures. The problem is when I try this the mux-dmm
example has a long setup time so the actual measurement takes place long after the 300ms delay. It seems like I need to use the
dmm-mux in continous mode first (say every 1ms), and then somehow trigger off the falling edge to pick off the 300th sample.
If you're using NI PXI-DMM cards, then it is possible.
@tadk wrote:
Unless there is a way to synchronize samples.