de-embedding a device from S-parameter measurements

[Martin.D]

I need to modify the calibration data of a VNA such that the effects of a device in the path of a 2 port s-parameter measurement is removed. I can measure the device that requires de-embedding and have the data in a .S2P file (touchstone format). The maths seems a bit tricky and I'm likley to spend significant time on this. I was wondering have any of you done this before and have some advice/code to help. I know this is possible because Agilent provide a macro that does just what I need. But running this macro cannot be automated, or at least no documentation is provided for this. I'm trying to get help from Agilent but I don't hold much hope, and I would much prefer the proces to be delt with in labVIEW anyway.

Than
ks

[JRA]

I have not worked with these devices and, since you haven't had any responses, it looks like not many have. However, I would suggest posting this in the Instrument Control Connectivity Forums and hopefully they can be of more help to you. Hope this helps you out!