02-12-2010 10:23 AM
I have a pattern image with me, and I want to detect any defects in the pattern.
The pattern could be concentric circles or a grid. I thought of using a imaq overlay
function and plotting it on the top of another image. Any ideas on this. RIght now I
am abl;e to threshold the image and see the defect. How should I approach this
problem.
02-12-2010
12:32 PM
- last edited on
04-16-2025
03:57 PM
by
Content Cleaner
If you can capture both a "good" image, you can use it to create a "Golden Template" and use it detect defects.
It's a lot to read, but I really suggest having a look at the NI Vision Concepts Manual.
If you're trying to recognize and categorize specific defects, then you'll have to "teach" those specific patterns. Look into Pattern Matching for that.
Good luck.