i am working on a wafer tracing project in Scancell which is making solar cells in Norway. the appearance of wafers are changing in every step in produt line. but only the grain boundaries on the wafer is the same. we want to identify wafers through recognize the grain boundaries. i want to find a software which can do this. i attach 2 pictures: one is the raw wafer in the beginning, the other is the wafer at last. you can see grain boundaries.