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load data in simulated devices

Is this possible, if not NI please add it.  I am using simulated devices all the time to develop code for modules I dont have in my machine but are at application sites.  I simulate these devices and continue with the coding with great success.  I have one change I would like to make.  The simulated devices are spitting out a sin wave (slight phase differences between channels) for AI data and Digital out apperes to have a repeating bit pattern.  It would be awsome If I could preload the data I expect for a specific applicatio dirrectly to the simulated devices (a buffer space or file reference in MAX?).  Can this already be done, if not can NI add this feature.  This option would greatly improve my efficiency of development.
 
Paul F.
 
 
Paul Falkenstein
Coleman Technologies Inc.
CLA, CPI, AIA-Vision
Labview 4.0- 2013, RT, Vision, FPGA
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Hi, Paul:
 
I use to use an "upper level" vi to manage devices I can't handle with (for example, devices at application sites, like you).
 
This "upper level" vi consists of
a case (selected with a boolean "Simulated")
   If Simulated is FALSE, then the vi to use with the device would be used.
   If Simulated is TRUE, then I generate the output I'd like to try, formatted as the actual device does.
 
Once you have a version that handles with the device at application sites, you don't need to use simulated device, may be you can focus on the outputs you could get with the approach I mention.
 
Hope it helps,
 

Message Edited by Aitortxo on 03-24-2007 03:17 AM

Aitortxo.
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Thanks for the reply.  I already have a simulated mode (boolean selectable) for all my modules which will simulate an action and serve as a place holder for the actual devices, but this is at a high level.  I would like to use the simulated devices provided with DAQmx calls which work great (IS timing call error checking and simulated data is all generated as if you had an actual device).  But what is missing is one more level of realism, the ability to specify a source for the data for simulated devices.  Here is an example, I have a rather complex custom Digital IO communication protocol,  I would like to test my parser and application using the simulated devices, this could be finished If I could specify the data which the digital input receives, I could test all command strings and possible error/invalid digital patterns at the toplevel application without any additional test code having to be written if I could specify that the default simulated data could be replaced with my own custom data.  I dont think this is possible yet with NI simulated daq devices.

 

Paul

Paul Falkenstein
Coleman Technologies Inc.
CLA, CPI, AIA-Vision
Labview 4.0- 2013, RT, Vision, FPGA
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Hello Paul,

Thanks for the great feedback. I would recommend that you visit our Product Suggestion Center here to pass along your request. This is our mechanism for gathering and tracking suggestions from our customers. We encourage you to let us know what you think and what features you would like to see added to our products.


Matt Anderson

Hardware Services Marketing Manager
National Instruments
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Will do.
 
Paul
Paul Falkenstein
Coleman Technologies Inc.
CLA, CPI, AIA-Vision
Labview 4.0- 2013, RT, Vision, FPGA
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