pattern extraction from wgl file format ... tool available ??

[wha@atmel]

Hello wireworkers,

in order not to invent the wheel again................. - my question.

Did already somebody of you extract   WGL format test patterns produced by FastScan; or is somewhere

a tool available  that  helps to extract this kind of Data ???

It is simply a Text-based  format and needs a lot of  searching and splitting until you have the rows and lines

filled with zeros and ones...... 

My target application is a Microcontroller, operating as Patterngenerator.  The timings in nanosec. region are not

of interest, but the logical behaviour.

Regards

wha

[test_guy]

yes, they are available and very expensive.  the ones i've used usually convert to an automated tester format for production manufacturing.  look at testinsight.com and tessi.com.  i don't know of any others but they are both in the $15k-20k range for a single user license. ouch.

[Savageaggie]

Hey guys, 

National Instruments has been working with Test System Strategies Incorporated (TSSI), an NI Alliance Partner to develop a new pattern conversion tool called the TSSI TD-Scan for National Instruments to enable engineers to import WGL and STIL vector formats into PXI.   The software coverts digital test vectors from either WGL or STIL to work directly with NI 654x and NI 655x digital devices. 

The software tool is available from TSSI and is included as a 30-day evaluation package with NI high-speed digital I/O PXI hardware.  You can also request an evaluation version at the link above. 

To learn more about the tool, check out the following whitepaper:  

Using TD-Scan with National Instruments High Speed Digital Devices (NI 654x and 655x)

Thanks, 

Scott Savage

Semiconductor Market Development Manager - Semiconductor Test

National Instruments