Hi
Hopefully somebody can help me with this.
I have used LabWindowsCVI to generate test code for a semiconductor product.
I have used LabWindows Test Executive as the sequencer to control the test and test operations. i have nested the test sequence
operation into three levels, first level batch information and wafer operation, second level individual selection of die on wafer and third
level actually tests the individual die.
However, when i have run a large number of tests (> 8000), the test executive software slows to a halt.
When i have looked at the code the software is slowing down / stopping when the tests leaves the third sequence and returns to the second
sequence. All sequences pre-loads the tests.
I have checked memory leakage and there seems to be a small amount of leakage but not enough to stop the program running.
I have checked my code but can't see an obvious cause of memory leakage.
Has anybody seen this problem before using the test executive sequence or have any suggestions what could be causing it.
Thanks
Ian