NIDAQ 6063E Analog I/O measurement problems

[Guady Bird]

What is the reason for having just noise when testing Analog I/O?

How can I do to discard hardware failures?, I’m suspecting hardware failures particularly because without any external wired up, the AO GND (Pin 54) is at ground level but AO GND (Pin 55) has higher potential.

I’m testing using the Test Panel (Measurement & Automation Explorer), Signal generator and Tektronix oscilloscope.

The results are as follow:

Self test passed alright

Digital I/O are fine.

+5V are fine

ANALOG INPUTS

The signal generator as an input means it’s a Ground-Reference signal source therefore the input configurations tested are Differential and NRSE described as follows:

TEST 1:

Analog Input

Channel: Dev0

Mode: On Demand

Input configuration: NRSE

Pin wired AI0 (Pin 68) AISENSE (Pin 62)

TEST 2:

Analog Input

Channel: Dev0

Mode: On Demand

Input configuration: Differential

Pin wired AI0 (Pin 68) AI8 (Pin 34)

TEST 3:

External measurement was made using a Tektronix oscilloscope and showing as a result just noise although I change the output range and voltage.

ANALOG OUTPUT

AO0/1

Mode: DC Voltage

[Kurt_NISalesEngineer]

Hi,

Thanks for posting your query on the National Instruments discussion forum. I’m wondering if you are using a shielded cable in your measurement setup. The PCI 6036E Multifunction DAQ card doesn’t have any onboard filtering so adding filters for each channel will help increase the signal to noise ratio. Ideally you would add filters as close to the signal source as possible, as this is where it is most effective. Have you used any external signal conditioning accessory like NI SCXI?

This article is great source of additional information about signal conditioning

https://www.ni.com/en/shop/data-acquisition/measurement-fundamentals/field-wiring-and-noise-consider...

I hope this helps!

Kirtesh Mistry

National Instruments UK & Ireland

[Guady Bird]

Thank you very much for your answer and link.

I'm testing with twisted pair of 5cm length because I just want to check the DAQ card before going to the full implementation. Also I was following the schemes suggested in the link that you have recommended.

The result is not a “noisy reading” it is just noise that doesn't exhibit any change when I change the signal generator or the range setting in the MAX options.

I have tested also the self diagnostic using internal virtual channels and the result is the same.

Could this behavior be the result of hardware failure?

[Kurt_NISalesEngineer]

Hi,

Can you verify external electrical readings being supplied or being read from the card, using a multimeter? Have you had the card in working order / condition at any point prior to this issue that you have reported? I'm not sure what driver version you may have installed but just to let you know, you can obtain the latest driver (free download) for the card from www.ni.com/downloads > drivers and updates link.

Productline - multifunction daq
Software - NI DAQmx
Version - 8.3.1
Operating System - ?

Essentially - it is better to exhaust all avenues before concluding that the card is not working because of hardware failure. - save you the hastle of going through RMA procedure / purchase. Also knowing this information would help us with any 'repair' and return requests.

I hope this helps!

Kind Regards,

Kirtesh Mistry
Applications Engineer
National Instruments UK & Ireland

[Guady Bird]

Thank you very much for helping me “to exhaust all avenues”, always it’s something else to try.

I have yet installed the last driver version (NI-DAQmx 8.3.1f0)

Summary of results:

1. “Test Resources” from MAX passed alright
2. Digital I/O are fine.
3. +5V are fine (Pin 8 - 14)
4. AO GND (Pin 54) is at ground level
5. FAILURE: AO GND (Pin 55) has higher potential
6. FAILURE: AIx steady noise (not noisy signal) (Config DIFF and NRSE)
7. FAILURE: AOx steady noise (not noisy signal)

Measurements media:

1. Signal Generator
2. Tektronix TDS 1002
3. Multimeter
4. Self diagnostic with virtual channels

The board was used before by different research groups therefore I have yet consulted to other owners about the functioning of the DAQ card and we all agree that must be some physical failures that require the knowledge of NI engineers.

Therefore I would like to know what the next step is in order to solve the problems.

Thank you very much again for your collaboration

[YatinM]

Hi Guady

Would it be possible for you to use this E-Series Diagnostic Utility, the link is below and has full instructions, it should give you a report to notify you whether your DAQ device is faulty or not.

Kindest Regards

YatinM

NIUK & Ireland

[Guady Bird]

Thank you very much for the link to self diagnostic. I runned the test and some test Failed to pass, particularly Analog I/O (attached file). I would like to know what is the next step in order to solve the problem.

Kind regards

[YatinM]

Hi Gaudy

To proceed with a RMA (Returns Merchandise Authorisation) you will need to call National Instruments on 01635 572 410, you will need to give some details and then the RMA of your device can commence.

Kindest Regards

YatinM

NIUK & Ireland