Hi,
I have an PCI-MIO-16E-1 (6070E) card which is now reported unreasonable result with my Summitek Instrument.
runing the self test in MAX reports OK.
but runing self-calibrate function in MAX reports error.
I have use the DAQ Diagnostic Utility v2.0 to test the device, the result is attached below.
my question is that:
1. what might be the problem with this card, is this card still usable?
2. can it be recalibrated by NI or it must be sent to repair?
Thank you for your help.
PS. I have an other card with the same model, but the test result is the same. Is it the calibrate methord problem, or they are both damaged.
Diagnostic Test results:
=======================
2008-9-19 11:36:39
Results saved to: E:\Diagnostic Results.txt
Selected Device: Dev1
Device Type: PCI-MIO-16E-1
Serial Number: B929CF
Device Support: (PASS)
NI-DAQmx Version: 8.5 (PASS)
Device Reset: (PASS)
WARNING: Your device has not been self-calibrated. For best resuts, it is recommended that you self-calibrate the device.
Running Calibration ... FAILED for the following reason:
Error -200545 occurred at DAQmx Self Calibrate.vi:1
Possible reason(s):
Measurements: Self-calibration failed. The self-calibration date has not changed.
Disconnect the device from external signals, as they might introduce noise. Externally calibrate the device to recalibrate the onboard voltage reference that is used for self-calibration.
-------------------- Testing Counters... --------------------
Testing CTR Buffered Pulse Generation... (PASS)
Testing CTR Single Pulse Generation... (PASS)
-------------------- Testing Analog Input... --------------------
Testing AI Ground Reference... (FAIL)
************ Test FAILED for the following reason ************
Analog Input was not within tolerance for ground reference. Expected to read: 0.000000 Actually read: 0.073842
*******************************************************
Testing AI Voltage Reference... (FAIL)
************ Test FAILED for the following reason ************
Analog Input was not within tolerance for reference voltage. Expected to read: 5.000000 Actually read: 1.595776
*******************************************************
Testing AI Finite Sample Clock... (PASS)
Testing AI Finite Sample Clock Frequency... (PASS)
-------------------- Testing Analog Output... --------------------
Testing AO Finite Sample Clock... (PASS)
Testing AO Finite Sample Clock Frequency... (PASS)
Testing AO Single Point... (FAIL)
************ Test FAILED for the following reason ************
This test failed to output 9.000000 Volts on Dev1/ao0. The actual value written was 9.997559.
*******************************************************
Testing AO Accuracy... (FAIL)
************ Test FAILED for the following reason ************
This test failed to generate a voltage waveform with an error of less than 0.192901 Volts on Dev1/ao0. The actual average error was 1.577645 Volts.
*******************************************************
-------------------- Testing Digital IO... --------------------
Testing DIO Lines... (PASS)
Testing DIO Ports... (PASS)
----- DIAGNOSTIC TEST COMPLETE -----
