National Instruments is hosting a special RF and wireless test event on May 24 in San Diego, CA.
RF engineers from NI will detail best practices and advanced measurement techniques for testing RF and wireless devices. Join us for presentations and discussions on topics ranging from instrumentation considerations to the essential knowledge you need in testing today’s RF and wireless standards.
Register Here:
http://sine.ni.com/nievents/app/offering/p/offeringId/765444/site/nic/country/us /lang/en
Event Details:
Date: May 24
Time: 9:00 a.m. - 5:00 p.m.
Location:
Country Inn & Suites
5975 Lusk Blvd.
San Diego, CA 92121
Agenda:
8:30 - 9:00 a.m. Registration and Networking
9:00 - 9:30 a.m. Keynote: Realizing the Benefits of Software-Defined RF
Instrumentation
9:30 - 10:15 a.m. Best Practices for Synchronizing Instruments in RFIC Test
10:15 - 10:30 a.m. Morning Break
10:30 - 11:15 a.m. Advanced RF Signal Analyzer Measurement Techniques
11:15 a.m. - 12:00 p.m. The Art of Benchmarking Measurement Speed: PXI Versus
Benchtop Instruments
12:00 - 1:00 p.m. Lunch
1:00 - 1:45 p.m. Fundamentals of Phase-Coherent Measurement Signals
1:45 - 2:30 p.m. Introduction to 3GPP LTE
2:30 - 2:45 p.m. Afternoon Break
2:45 - 3:30 p.m. Advanced Network Analyzer Measurement Techniques
3:30 - 4:15 p.m. Using a Signal Analyzer for Real-Time Signal Processing
and Recording
4:15 - 4:30 p.m. Closing Remarks
Session Descriptions:
Keynote: Realizing the Benefits of Software-Defined RF Instruments
The last decade has seen a growing trend in the RF and wireless test industry toward modular, software-defined instrumentation. The driving force behind the adoption of PXI as the standard for automated RF test largely centers around three benefits: faster measurement speed, broader instrument flexibility, and lower-cost measurement accuracy. In this session, get a high-level overview of PXI instruments and share real-world examples where using PXI has provided engineers with real benefits.
Advanced RF Signal Analyzer Techniques
Getting every last dB of dynamic range for a particular measurement often requires careful attention to a number of signal analyzer settings including reference level, LO power, and IF bandwidth. In this session, discover some of the fundamental trade-offs between each of these settings and their impact on both measurement accuracy and repeatability. In addition, review basic techniques that you can use to determine whether you are measuring the performance of your DUT or the instrument itself.
Fundamentals of Phase-Coherent Measurement Signals
RF signal generators and analyzers have traditionally been single-channel instruments, but applications such as beamforming and MIMO require multichannel, phase-coherent instrumentation. In this session, take a detailed look at the architecture of a 4-channel RF signal analyzer, see how channel-to-channel phase coherence is achieved, and contrast sharing reference clocks between multiple channels against sharing LO signals directly. In addition, discover how factors such as phase noise, input bandwidth, SNR, and other characteristics can affect the phase coherence between multiple input channels.
Introduction to Testing 3GPP LTE
This session features an overview of the 3GPP LTE physical layer as well as information on common RF measurements for LTE including transmit power, adjacent channel power, and error vector magnitude (EVM). This presentation also offers the best practices for automating LTE measurements in design validation or production test applications.
Advanced Network Analyzer Measurement Techniques
Vector network analyzers (VNAs) are some of the most complex RF instruments, but you can use them to perform a wide range of measurements. In this session, examine basic VNA calibration techniques as well as more advanced measurement concepts such as time-domain measurements.
The Art of Benchmarking Measurement Speed: PXI Versus Benchtop Instruments
For engineers automating measurements, speed is everything. However, quantifying the measurement speed is often difficult, requiring careful attention to many settings such as averaging, number of symbols, capture period, and other factors. In this session, explore the fundamental trade-offs for each of these factors and obtain best practices to optimize overall test time. In addition, walk through an in-depth benchmark comparison with a common rack-and-stack instrument to see how it compares with PXI.
