I'm trying to reduce my PXIe-4141 measurement rate below 16.6 ms, but haven't had any luck. I have found a number of similar posts, but nothing has helped so far.
My setup:
I'm using 1 channel on the PXIe-4141 to force a voltage on a pin on an IC. The PXIe-4141 is configured in single point mode, with "measure when" set to "on demaind" (1026). I'm programming with the C-dll with nidcpower version 1.9. After the inital configuration, I perform a series of current measurements. Between each measurement the IC's configuration is updated and the current output will change slightly. This is all automated so the configuration change happens within 1ms. The settling time of the current is ~10us. To measure the current I call "niDCPower_Measure". No addition pxie-4141 configuration is happening between measurments. Each call to niDCPower_Measure takes about 16ms when configured with 1 PLC or less for the aperture.
What I have tried:
I have played with the aperture with no luck. I can set the aperture to 10 and the measurement time will be 166 mS (as expected). I can set the PLC to 1 and the measurement time is 16 mS (as expected). If I set the PLC to .1 the measurment time is 16ms (not as expected). I would expect the measurement time to drop to closer to 1.6mS.
I have set source delay, and found that is doesn't effect my measurements.
I tried to play with "samples to average" but the only accepted value is 1. This match with what the help document says too. I don't think the PXIe-414x device supports this feature.
The dc noise rejection is set to NIDCPOWER_VAL_NORMAL (1044 ). I don't think this would actual impact sample rate based off the documentation.
If anyone can help me configure this device to reduce the sample rate, I would appreciate it.
Thanks,
Ian
