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2013 GSDAA Finalist: Optimization of Parametric Defect Localization on Integrated Circuits

by Member on
‎06-24-2013 11:15 AM
- edited on ‎12-03-2024 08:22 AM by: Member Content Cleaner
2013 Automated Test Finalist
Optimization of Parametric Defect Localization on Integrated Circuits

 

Authors: Luc Saury and Sebastien Cany, ST-Ericsson and STMicroelectronics

 

Challenge: Optimizing our fault-localization tool to address complex failure analysis cases on integrated circuits.

 

Solution: Improving the performance of our PXI-based tool dedicated to parametric fault localization by setting a “handshake” mode between NI modules and building digital variation maps.

 

AT - Default Localization Setup.jpg

To vote for this submission for the 2013 GSDAA Community's Choice Award Winner, "Like" this document. Click on the "Like" symbol in the bottom right corner of this window.
To read the entire paper for this submission, download and view the PDF attachment on this document.