Author: Doug Johnson, Qualcomm Atheros
Challenge: Keeping wireless local area network (WLAN) test costs low and test accuracy high while reducing characterization times as device complexity grows by tracking an increasing number of wireless standards.
Solution: Using the NI PXI-based vector signal transceiver and the NI LabVIEW FPGA Module to create a customized, flexible WLAN test system that delivers a 200X reduction in test time compared to previous rack-and-stack instruments, resulting in lower test costs and better device characterization.