ID: TS7759
Abstract: To meet time-to-market demands for increasingly complex devices while maintaining proper test coverage, engineers must quickly develop mixed-signal test systems that are both faster and more comprehensive than ever before. At this session, examine architectures that you can use to accelerate complex mixed-signal tests across both validation and production and explore real-world examples of how this can reduce the overall test cost for organizations. Examples range from improving analog measurement noise and response time to using FPGA-based instrumentation for custom test sequencing.
Speaker: Mike Watts, National Instruments, Modular Instruments Product Manager
