ID: TS5738
Abstract: Examine the automation of a two-tone intermodulation distortion (IMD) test system. IMD measurements, which can describe the nonlinearities of an RF power amplifier (PA), are useful figures of merit for PA designers. This measurement is performed by injecting two tones into the input of the PA and measuring the third-order distortion products at the device’s output. In this session, learn how the LabVIEW state machine architecture was used to automate RF test hardware for exploring the relationship between the device’s linearity and DC bias conditions to maximize the device’s efficiency.
Speaker: Bryant Baker, TriQuint Semiconductor, RF Test Engineer
