Past NIWeek Sessions

cancel
Showing results for 
Search instead for 
Did you mean: 

Avoid Common Mistakes When Integrating Switches Into Automated Test Systems

ID: TS7999

Abstract: Explore ways to efficiently integrate switches into automated test systems for improved throughput and reduced system costs. From choosing the right architecture to making connections in software and hardware, this session thoroughly covers switch implementation and shows you how to simplify connectivity with mass interconnect solutions.

Speakers:

Mike Watts, National Instruments, Modular Instruments Product Manager

Dave Wilson, MAC Panel Company, Director of Global Sales and Marketing

Contributors