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Built for Speed: How to Optimize SMUs for High-Throughput Testing

ID: TS7419

Abstract: High-precision DC measurements frequently need a long measurement cycle to ensure proper signal integrity. However, many of these measurements are often unnecessarily throttled because of software overhead, long settling times, or inefficient measurement engine use. At this session, discover how to optimize source measure units (SMUs) for test throughput while maintaining an acceptable level of precision.

Speaker: Jake Harnack, National Instruments, Product Marketing Manager

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