ID: TS6403
Abstract: Some test applications contain high channel counts and high sample rates, so saving all the data and postprocessing for analysis is not practical. Learn how the use of an FPGA to preprocess the digitized input waveforms can greatly reduce the analysis time and storage requirements necessary to determine product acceptability.
Speakers:
Ryan Smith, CertTech, LLC, Senior Staff Engineer
Alan VanDeusen, CertTech, LLC, Director of Systems
