ID: TS3245
Abstract: When writing software, defects are inevitable. A single defect found late in the development of embedded control systems can put a project's success at risk. At this session, explore a new toolchain that combines IBM Rational Rhapsody and NI technology to test embedded software earlier in the development process. With test methods historically used during hardware-in-the-loop validation, embedded software developers can find defects as they develop before official verification even begins. By discovering defects earlier when they are easy to fix, developers can minimize the overall cost to test and reduce rework, which results in higher quality embedded software, lower overall costs, and less risk.
Track/Summit: Data Acquisition Systems
Speaker(s): Nicholas Keel, Product Marketing Manager National Instruments
Paul Urban, Business Development Manager IBM
