ID: TS7878
Abstract: Because of the increased demand for automotive reliability and passenger safety as well as expensive component recalls, automotive companies must perform full lifetime and durability test for various electronics before progressing to full production. Cost-effective data collection across multiple units with high I/O at high sample rates presents several challenges. At this session, learn how Delphi engineers rearchitected their test system using the NI platform to achieve this goal and generate test sample rates over 1200X greater than those produced by the previous system.
Speakers:
Robert Bonesteel, Delphi
Steven Kaufman, Delphi, Validation Engineer
Weng Dean Leong, Delphi, Validation Development Engineer
