ID: TS4282
Abstract: Hear from the experts on state-of-the-art techniques for component design, characterization, and optimization. Explore elements of nonlinear characterization, Doherty amplifier design, and the benefits of envelope tracking.
Track/Summit: RF and Wireless Test Summit
Speaker(s): Christian Fager, Assiciate Professor Chalmers University of Technology
Takao Inoue, Senior RF Platform Engineer National Instruments
Zoya Popovic, University of Colorado
