Advances in Software-Defined and Synthetic Instrumentation for RF and Microwave
Track/Summit: Aerospace and Defense Summit
Session ID#: TS1523
Abstract: With the appropriate software and advances in analog-to-digital converters, high-speed data buses (PCI Express), and high-performance computing, modular test systems can be configured to create software-based tests or measurements and the user interface for most RF test requirements. At this session, review advances in synthetic and software-defined instrumentation (SI/SDI) with an emphasis on PXI-based SI/SDI architectures and the performance, size, cost, and software development associated with the implementation of various measurement modes for RF and microwave applications.
Speaker(s): David Carey, Wilkes University
Robert Lowdermilk, RADX Technologies, Inc.
