Keynote: Challenges of RF Test in HVM
Track/Summit: RF and Wireless Test Summit
Session ID#: TS2240
Abstract: A discussion on the challenges of bringing RF test to high volume test solutions. The cost of testing mobile device SOC/SIP's is driving hard choices in production testing. Zero test time or zero capital equipment or infinite parallelism; each corner drives complexity and compromises in the test platform. As SOC/SIP devices drive complexity up, traditional HVM methods and equipment are challenged from both capability and cost point of view.
Speaker(s): Jin Pan, Intel
Kevin Redmond, Intel
