NI combines the functionality of high-speed digital I/O with four-quadrant parametric measurements in one powerful and easy-to-use module. Learn how to use the latest PXI express high-speed digital I/o with per pin parametric measurement unit (PPMU) modules to test common semiconductor components including digital-to-analog converters, RF power amplifiers, and microelectromechanical system (MEMS) devices.
Patrick Webb, Product Manager, NI
