ID: TS6411
Abstract: Characterizing analog modules in microcontrollers using bench lab equipment instead of traditional ATE is becoming more critical with the pressure to reduce test cost. However, reducing bench test times using parallelism has not been easy. The main reasons for this are the loss of accuracy, the expense of buying multiple instruments, and software complexity. At this session, hear how Freescale Semiconductor used LabVIEW, TestStand, and the USB-8452 interface to develop a new, fast, and accurate method for creating scalable parallelism for device characterization. This has led to about a 2X reduction in test time that is constrained only by the number of sockets that can fit on a test board.
Speakers:
Mark Farrell, Freescale Semiconductor, NPI Analog Validation Engineer
Jose Muniz, Freescale Seminconductor, NPI Analog Validation Engineer
