Speaker: Patrick Buckley (Research Scientist, Georgia Tech Research Institute)
Test and evaluation platforms continue to evolve as technologies under test grow more complex. Investing resources in custom, one-off applications requires more time and money than a modular approach. At this session, explore several small, modular NI platforms for embedded test and evaluation. With modular LabVIEW software ready for deployment onto any NI FPGA-based hardware, you can take advantage of a wide range of capabilities with little or no custom development. Also learn how to use the Real-Time Innovations Data Distribution Service (RTI DDS) Toolkit for remote databasing and visualization.
