Speakers:
Miguel Caballero (Test Engineering Manager, Qorvo)
Gregory Freeman (Senior Systems Engineer Team Lead, Good Automation)
In the semiconductor industry, every millisecond counts. Qorvo, a global leader in RF solutions for mobile, infrastructure, and defense, needed to decrease test times or spend millions of dollars on new test equipment to keep up with the market demand for its BAW filters. At this session, learn how Qorvo teamed up with Good Automation to develop an event-driven, multithreaded hardware abstraction layer with a database back end. Using LabVIEW object-oriented programming, the companies cut test time by 30 percent, eliminated software overhead, and greatly simplified hardware changes.
