04-20-2016 06:45 AM
May be somebody use Wireless Connectivity solution (WLAN/BT test). There is link to it - http://www.ni.com/rf/test/.
Idon't understand one thing. Do the TestSet work as "access point" during a test of DUT?
For example, CMW500 (R&S), MT8860C (Anritsu) work as "access point" during a test of DUT.
Or, NI TestSet may some another modes for testing DUT?
Regards
Ruslan.
Solved! Go to Solution.
04-21-2016 07:40 AM
I try to understand, have WLAN Test this or not: "Network mode greatly simplifies the measurement set-up and allows any
WLAN device to be tested in a mode that closely reflects its native operation. The MT8860C built-in reference radio simulates both an Access Point (AP) or
client device/station (STA), and using standard protocol messaging, establishes a network connection with the DUT. Once a connection is made, both the
transmitter and receiver of the DUT can be tested without the need for control software from the chipset vendor."
04-21-2016 10:22 AM
Ruslan63,
Short answer:
The NI WLAN toolkit does not act as an access point. It provides analysis measurement and waveform generation compliant with IEEE 802.11 a/b/g/n/j/p/ac/ah/af. You must be able put your device in test mode and have it transmit packets or report packets it has successfully received.
Longer answer (drawing from some notes I've made):
Two main methods for testing are signaling or reduced-signaling, and non-signaling. NI supports non-signaling. There are pros & cons to each. Here is a quick table showing some differences.
Signaling | Non-Signaling | |
Test Speed | slow (mins) | fast (secs) |
Test instrument Cost | high | low |
Development time | low | high |
Test sw/protocol stack | Yes | No |
Device test mode required | No | Yes |
If you are required to test the software/protocol stack of your device, or if you have no means by which to control your device in test mode, then you must use signaling, and cannot gain the benefits of non-signaling.
Today the trend is to use non-signaling for regression testing during product design and validation, and for production test. Developers are buying modules and chipsets for which the vendors have already validated the software and protocol stack. As long as the developer doesn't mess up the chip/module, then product failure risk is very low. Thus, as designers put the chip/modules in a circuit, they can use non-signaling regression tests to quickly validate that the RF functionality (i.e. RF physical layer) of the chip/module has not been compromised. A subset of this very fast, parametric test can often be re-used for production test. Again, as long as the production process doesn't mess up the chip/module, then the failure risk is low.
Of wireless products, WLAN were one of the first to use non-signaling test. Almost all WLAN vendors have a driver to control the device in test mode. The general categories of control are similar (e.g. Tx N packets of given type at given power), but the commands are not standardized between vendors. Also the interface for the device test mode control varies (e.g. UART, USB, SDIO).
Bluetooth LE has a standard interface based on COM port and the command set is the same between vendors (NICE!). Because of this, NI was able to create device control libraries as part of its Bluetooth test suite.
Cellular device control varies like WLAN does, and they lagged in non-signaling test, but are now driving it hard due to high volumes and $$$$. By the way, a cellular signaling test can take 2-3 minutes vs 10-20 sec. And, if the call "drops" you don't have many options other than running the test again. And, the test equipment cost can be >5x.
Navigation receivers can acquire a simulated satellite(s) signal (e.g. Using NI GPS Toolkit) and very quickly provide a carrier to noise measurement on the N satellites signals detected. While this is not truly non-signaling, it represents time savings based on the same approach that the software/protocol stack required to lock onto to 'good' satellite signals has already been validated and is low risk. Waiting for a satellite lock can take minutes, which for many is unacceptable, especially in production test.
As the cost of chips drop, functionality increases, the cost of test becomes a larger % of the product. Companies are now demanding improved non-signaling test support to control costs. In my opinion, any chip/module vendor that doesn't offer non-signaling test support will loose market share. This should be one of the first question a company asks before decided on a chip/module vendor because the test costs can sometimes outweigh the chip costs!
I have worked with a variety of companies
A) that have 0-2 more expensive signaling testers for design/validation, while having many more (10x) non-signaling testers for regression testing and production test.
B) who produce high mix low volume products where they only have 1-2 signaling testers for all testing. In their case the benefit of not having to spend time developing device control code is the biggest savings, and their test time/throughput is not important.
C) who have no means of device test mode control (e.g. sealed device) and only have the option of signaling test.
NI is focusing on company A types.
Hopefully this clarify things.
04-22-2016 03:10 AM
Thanks for real answer 🙂 I didn't have such answer in the local office NI in Moscow. The NI WTS/WLAN System is very suitable for us, but with AP mode only 🙂 I work in a confirmation labaratory, and we are making RF confirmation tests for our market. If NI'll add SW for emulation AP for VST, the NI WTS/WLAN solution may be a best choise for our case. Is it so hardly?;-)
Regards
Ruslan.
04-22-2016 04:50 AM
I think it need an SW option for VST like "SoftAP".
04-22-2016 07:12 AM
http://www.ni.com/white-paper/7143/en/ - Industrial Wi-Fi Point. Is it possible add this function to VST?