Enhance your NI LabVIEW development skills and network with other LabVIEW users in San Diego, CA on Tuesday, February 7. This user group meeting is complimentary and dinner will be provided. Please reserve http://app.demand.ni.com/e/er?s=639&lid=50813&elq=eb156306ee6a450892210e6da16ca0a8your seat today.
February 7, 2012
6:00 - 8:00 p.m.
Country Inn & Suites
5975 Lusk Blvd.
San Diego, CA 92121
Register Now!
Agenda:
6:00 - 6:30 p.m.
Networking & Complimentary Food
6:30-7:30 p.m.
High Speed Digital and Parametric Testing for Semiconductor Devices, Presented by DJ Loberg, National Instruments Staff Engineer
National Instruments has entered a new era of semiconductor test with the release of its Semiconductor Suite. Besides the new high performance RF analyzer, RF solid state switch and 12 GS/sec digitizer it has released the first PXI Express digital pin electronics card, the PXIe-6556, as well as the high density SMU, the PXIe-4141. This session will highlight the capabilities of both products and how they are being used for semiconductor test in areas such as ADC/DAC, MEMs, RFIC and PMIC test. This session will demonstrate semiconductor device test with these new products.
7:30 - 8:00 p.m.
Questions & Discussion
Registration Link:
http://sine.ni.com/nievents/app/offering/p/offeringId/959827/site/nic/country/us/lang/en
