HP 4145B Semiconductor Parameter Analyzer by Labview2012 for Student Design Competition 2013

[Kazmir]

Contact Information

University: Korea University

Team Members (with year of graduation): In-yeob Na, Sang-jin Lee, MingXing Piao, Jong Mok Shin (1~2 graduate students)

Faculty Advisers: Gyu-Tae Kim

Email Address: w7g3ss@gmail.com, narhak88@daum.net, piaomx@gmail.com, jmshin89@gmail.com

Submission Language: English

Project Information

Title: HP 4145B Semiconductor Parameter Analyzer by Labview2012

Description:

<Insert brief, one- to two-sentence description.>

The achievement of the several key filed effect transistor (FET) parameters simutaneously with LabVIEW soft connected with Semiconductor Parameter Analyzer (Agilent Technologies 4145B).

Products

Hardware: NI USB-GPIB-HS(Part Number : 187965B-01)

Software: Labview2012

NI GPIB USB HS Driver

Additional Toolkit: None

Other Hardware: HP 4145B

              PC or Notebook Computer

              Device Measuring Chamber, Measuring TipThe Challenge

<Which problem were you solving? Insert the description of your project.>

When analysis the performance of field effect transistor (FET), several key device parameters including the on/off ratio of the current, transconductance (g_m), subthreshold swing (ss), threshold voltage (V_th) are needed. With the current LabVIEW, only I-V curve could be obtained directly during the measurement, the parameters mentioned above have to be calculated through other tools. In our project, the mentioned device parameters could be acquired with the I-V curve simutaneously, which is much more convenient for the operatation.

The Solution

<Explain how your project works.>

Agilent Technologies 4145B was chose as the Semiconductor Parameter Analyzer, LabVIEW soft was designed and connected with 4145B. We upgraded the current LabVIEW soft for device measurement at the base of the current one, which could acquired some other key device parameters during the measurement.

<Explain the benefits using LabVIEW and NI tools.>

The use of LabVIEW and NI tools made the experiment measurement automatically and the data visualization.

<Insert image(s) of project with captions.>

<Insert video here.>

Attached File

<Attach VI code (optional).>

Attached File

<Level of completion (beta, alpha, or fully functional)>

Fully functional

<Time to build>

1 Month

<Additional revisions that could be made>

Attach Poster (30 in. x 38 in.) and LabVIEW Code

Attached File

<Include captions for all graphics material. Type your photo or graphic caption underneath each graphic using this 10 pt Times New Roman font. Embed all graphics. Remember—you must provide individual electronic files for each graphic you include in your paper. Place photos in text after first reference—you must include a reference to all graphics in the text. Include screen captures if you use National Instruments software products. Screen captures must have a minimum resolution of 72 dpi at 100 percent. All other graphics must have a minimum resolution of 300 dpi.>

Attached File - photo instrument.doc

Nominate Your Professor (optional)

<Insert nomination. Does your professor use LabVIEW or other National Instruments technology to make learning difficult concepts engaging, interesting, and fun? If so, nominate him/her as an outstanding educator by telling us who they are, what they teach, and how they make learning a better experience for you.>

This project is supported by semiconductor device processing which is graduate lecture in Korea University. Thanks for the instruction of professor Gyu-Tae Kim and Sang-Ho Lim