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Suggest NI produce an inexpensive (<$100) USB "stick" that has 2 hardware counters on it for optically isolated measurement of encoders, or other high-speed devices. The stick would have a standard connector it for easy wiring of differential encoders with ABZ lines. The device would enable measuring two separate encoders or track two sections of a shaftless drive line that needs to position-follow. One or two DIO lines would be a bonus. This would seem to be a good fit for the industrial machine markets (at the very least). Today you need to buy a multifunction daq for a several hundred dollars if you want two counters.

 

Contact me with any further questions.

 

 

Thank you!

 

Rick Yahn

QuadTech, Inc.

414-566-7938

rick.yahn@quadtechworld.com

 

Measurement and Automation Explorer MAX's Test Panel's Analog Input provides a quick method to examine a signal and vary acquisition parameters.  It would be useful to be able to zoom the time axis and have a cursor display so that for example noise level or rise time could be looked at in more detail.  The time axis limits can currently be manually overwritten as a way to zoom but that is cumbersome.  Assuming the graph being used in this test panel is built from a standard NI graph, it should have zoom and cursor capability already part of it and thus easily added.

 

Steve

 

Not sure if this should be in another category, but here is the idea.

 

In DAQmx you  can register for events like Change Detection Event, Sample Complete Event, etc. These events occur in the Event structure.

 

Idea: Extend this capability to NI-Sync.

For example allow a future time event to occur in an event structure, instead of firing a TTL pulse. The steps would be:

1. Create a new NI-Sync instrument driver session;
2. Read the current time of the clock;
3. Define when the event will be generated by introducing a delay to the current 1588 time;
4. Program when the event will occur at the specified time;
5. Register for Event
6. Event Occurs - do something.
7. Clean Up

See below for diagram.

mcduff

FutTimeEvent2.jpg

In the DAQmx Physical Channel Control if Analog Input is selected I would like to filter on the type of module i.e. Thermocouple, strain, Current, etc.

Filter Analog Input Measurement Type.jpg

Would it be possible to update the export wizard in MAX so that the NI-DAQmx Tasks list under Data Neighborhood is listed in alphabetical order?  In the main MAX application the list is in order, so finding tasks that are named with a common prefix is easy.  However, in the export wizard you have to scroll and hope you clicked them all.

 

Thanks,

-Brian

Certified LabVIEW Developer

Lead Engineer - LabVIEW

Advanced Development

GE Appliances

 

T 502-452-3831

F 502-452-0467

D *334-3831

E brian.schork@ge.com

Currently, there is no way to format a .txt file to log data with a time stamp that includes the current time that the data is being acquired. When creating a "Save to ASCII/LVM" event, the "Time Axis Preference" setting under the File Settings tab has two options: Absolute Time or Relative Time. Relative time works as expected, logging the time starting from 0 seconds until the data acquisition is complete. However, the Absolule Time setting logs the time stamp as time in seconds from some arbitrary point in time, usually the Windows system time in seconds. 

 

This timestamp is essentially useless without a conversion to the actual time. It would be great if the Absolute Time logged the current time in hours:minutes:seconds instead. 

The 6602 can take an external timebase up to 80 MHz (according to the spec, it's actually a bit higher than this in reality).

 

The newer counter products do not have this capability (e.g. the 6612 has the same 25 MHz bandwidth limit as most of the multifunction products).

 

 

So whenever an application comes up (e.g.) where the user wants to count a fast external signal, the only reasonable option from NI is the 6602.  This is fine for now, but in the future it would be nice to have some higher bandwidth counter options (unless you plan on selling the 6602 forever... hopefully it doesn't get too hard to come across computers with spare PCI slots though).

I can't say I've investigated this at all, maybe it's already moving this way; all hardware should have it's own available parameters stored on-board, available to be read back by software, for example on startup. Things like available, valid, ranges in volts, current, frequency, channels etc...

 

It would always be a good idea to read those parameters from hardware by software, instead of relying on model number, manuals, drivers. Then, software could easily adapt to different models of the same main type. Plug in a new hardware and it would announce what it's main capabilities are.

 

My2c

I miss the possibility to select Global Virtual Channels defined in MAX into my Flexlogger project.

It is a lot faster to setup a measurement project for systems that don't change the connected sensors so often. 

Please add support for this.

Hi,

I am aware of the previous idea here on a filter for the USB DAQ devices, this time I propose a different solution.

Some cDAQ moduls include an anti-aliasing filter, see a documentation here: https://www.ni.com/en/support/documentation/supplemental/18/c-series-modules-with-anti-aliasing-filters.html

In many cases our cDAQ and cRIO system could be the solution to higher frequency (100 kS/s - 1 MS/s) voltage signal acquisition if the signal could be (from LabVIEW) programmatically conditioned prior acquisition. Two main processes are required most: amplification/attenuation and filtering.

I think amplification/attenuation is a trivial processing step, I just mention here a flat frequency and phase transfer requirement in the working range, allowing a bypassing of this stage.

Filtering is a little more challenging. My proposal is a "tunable" anti-aliasing filter, fo the sake of simplicity with one programmable cut-off frequency and fixed roll-off charasteristics. Similarly high pass and band pass filters could be implemented but these are just nice-to-have features. Please note that all filters should be in hardware, e.g. some ASIC before any ADC.

Thanks for your attention

Cheers

Istvan Pinter | Sales Development Engineer, EMEIA

Hello

 

I don't know if there is already an "idea exchange" about this, it could be usefull that USB devices or adapter support USB 3.0.

A device isn't recognized through an USB 3.0 port.

 

Thanks !

 

Vincent O.

It seems the only indication in MAX that a device is simulated is that under the Devices and Interfaces section, the tiny glyph to the left of the device name is colored yellow instead of being white/transparent.  I end up not remembering what color means what.  It would be useful to add text "Simulated" next to the device name.  It would also help to distinguish simulated devices by having the color of that glyph be green (instead of its current transparent/white) when the device is installed and detected.  Have the color change to red (and keep the existing red X) if had been detected and a device number assigned but is currently not installed/detected.  Then simulated devices being yellow may imply "warning/caution" or "not real".  Perhaps also have a help-hint popup ("Detected" or "Not Detected" or "Simulated") when the mouse hovers over device names.

 

MAX Simulated Device.jpg

Some users have expressed that they would be interested in getting a 4 port version of the USB-8502/2 CAN interface device with a metal housing, instead of plastic. 

This is pretty trivial to achieve through LabVIEW itself, but...

 

Signal Express is a simple, stand alone data acquisition system that allows those with limited exposure to LabVIEW set up simple test and measurement routines. One area where this is ideal - at least, for me - is in environmental or long life testing. Instead of crafting a beautiful piece of custom software for my colleagues, I can hand them a DAQ, point them in the direction of the SignalExpress and DAQmx installers, and off they go. With a little fiddling, they can create a logger that suits their needs.

 

One thing I've noticed, however, is that when sampling with non-simultaneous cards such as the USB 6225, users will select 1-pt-on-demand, set to some big interval, and then come back screaming at the top of their lungs - "OHMYGOD THERE'S CROSSTALK BETWEEN CHANNELS!". With a little bit of fault-finding, it's easy to point out that it's not crosstalk, but ghosting between channels, because I would guess that 1-pt-on-demand uses interval sampling and rattles through the multiplexing as quickly as it can.

 

My idea: give users the option to either select round-robin mode with a sensible delay, or complete control over the interchannel delay.

 

I realise that the standard line is usually "use LabVIEW" - I do - but I'd rather spend my time working on the important stuff and empowering those with less experience and/or exposure to make accurate measurements.

I use a PXIe-6363 which a wonderful device.   But it lacks level shifting at the digital I/O.

 

I would recommend that most DAQ multi-io devices support programmable and externally driven level-shifting for digital IOs.   Range for DAC driven level-shift (0.8 - 3.6, 5V),  and support for external input.   It would also be nice if multiple ports are present that some of them allow independent logic levels.  Default level should be 3.3V.    Port configurable pull-up, pull-down and latch-hold.

I rarely have to set up hardware for a new analog measurement and always have to puzzle over the difference between RSE and NRSE modes. I think of the inverting input as the reference, so "Non-Referenced Single-Ended" doesn't make sense to me. And, if I run the AISense line to my remote sensor, isn't that a Referenced Single-Ended measurement?

 

Yesterday, I noticed that at least some on-line documentation now refers to GRSE (Ground Referenced Single-Ended); adding that single letter helps a lot. What about adding another single letter and referring to the other mode as RRSE (Remote Referenced Single-Ended)? One letter could save a lot of people a lot of time.

When using TEDS load cells it would be useful to have a built in tare function  The null offset function only offsets the electrical value by the intialy measured amount.  This essentially shifts the calibration curve horizontally only.  The tare function could also shift the calibration curve vertically, in the load direction.  Since two point calibrations don't always create a line that goes through zero, a tare function is needed to get to zero.  Please see the attached VIs.  Also, check out my thread on this subject.

 

http://forums.ni.com/t5/Signal-Conditioning/9237-Null-Offset-with-TEDS/td-p/1499954

 

In NI MAX, mV/(m/s^2) should be added to the available choice in the dropdown menu for accelerometer sensitivity units.

 

(Currently avaliable choice is only mV/g and V/g)

Currently there are only two options available if you want a C-series card that has ±10V analog inputs with internal excitation voltage. Both of the available options have serious limitations which makes them impractical in dynamic testing environments. 

 

9218: With two input channels, it is impractical for large channel count testing. As an example at our test facility, we may run 60 analog channels which would require 30 of these cards. That would require 4 cRIO chassis' 

9219: With a max sample rate of 100 s/s, it cannot be used in a dynamic environment to accurately record data. 

 

 

 

There are two options that would be very beneficial to dynamic testing:

1) Add more input channels to the 9218 card so that high channel count tests don't need 3+ cRIO's. 

2) Make a new card similar to the 9218 with less capability but more input channels (No bridge, no IEPE, no ±20mA). 

For example:

± 5V, ±10V, ±60V Input Range

± 1V, ± 5V, ± 10V Internal Excitation

Minimum of 4 analog input channels.

Sample Rate 5 Ks/s

 

Does anyone else have a need for a card like this?

In MAX, you can open up a test panel for a DAQmx device.

 

I woudl like to format the numbers on the axis of the graphs. I have a calibration routine that requires that the signal get as close to 5 V as possible. When you get to less than 10mV, you the numbers on the vertical axis go from 5.01 to 5. So all you see on the graph is a bunch of 5's. It would be nice to be able to see the values in as much resolution as the channel will handle. Even at the maximum range, it can still do 2mV per bit. It would be nice to see 5.004 instead of 5.