Hi Chris,
Thanks for your answer.
I have taken tests for sample periods different than 2s. In the PDF file of my original post, starting from test 01-0050, you can find tests for periods of 2.1s, 1.9s, 3s, 1s and 0.1s. I can only arrive to a little more than 100S/s because I'm taking single point measurements. Since my final application will not require waveform acqusition I only want to try it (rearrange my code) if I find it necessary. This is, if taking samples at 900S/s will reveal somthing 100S/s cannot reveal.
I've just done new tests for sample times of 2s, 1s, 0.1s and 0.01s. (0.5S/s 1S/s 10S/s and 100S/s respectively). I've also changed the NI probe that was shor-circuiting the DMM input for a smaller (3cm) copper cable. Spikes still there. I attach the graph of recent tests. Watch out the first graph since
temperature effects are big.
The time between spikes actually change. It becomes smaller as the sampling rate is increased. However it seems the "number of samples" between spikes remain somewhat constant, which is not nice since it suggest that it is something the DMM is doing each number of samples without being requested to.
Question: Does your powerline frequency is 50Hz?
Notice also that these spikes are found the same, but of 4mOhms of amplitude, if the DMM is configured to measure resistance in the 100 Ohms range for apperture time of 1ms.
For my application: highly stable temperature measurements, these spikes are not welcome at all...
Thanks
Jose Ospina