Robert,
There is no built in functionality in CVI for mask testing. I found an example around here that you can find usefull. It generates a simulated noisy signal and an upper and lower mask. Since the simulated signal has a random phase it performs a software trigger to align the data and then checks element by element whether it fits in the mask.
Please take a look at this example and let me know if you have any further questions. This is in CVI version 7.1, however you should be able to open the UIR in any version (disregard the warning) and save it back to the CVI version that you are using.
I hope this helps.
Regards,
Juan Carlos
N.I.