Tomas,
In your example, the data stored into memory would be rows 1 and 2 as a single sample, then 3 and 4 as a single sample, etc. Pardon my artistic abilities but I drew up a quick timing diagram to illustrate.
This illustration is of a quick test I ran here at my desk. In my test, I have a device (6542) generating data on channels 0-7. I have channels 0-3 generate on the rising edge of the clock (TCO is illustrated) and channels 4-7 generate on the falling edge of the clock. In this fashion, I can simulate your DDR source where I have data being generated on the rising edge and falling edge of the clock. Also, I generate a data active event on the rising edge of the clock to be used as a start trigger.
I then connect the exported sample clock from my generation into STROBE of my acquisition, and channels 0-7 to channels 16-23. I configure channels 16-19 to acquire the data on the rising edge of the clock and channels 20 to 23 to acquire on the falling edge of the clock. Also, I setup a rising edge start trigger to be sampled on the rising edge of the clock (driven by my data active event).
The drawing shows the timing relationship between the exported signals and the sample positions. In this case, my first sample begins at the start trigger and includes the first rising edge AND the first falling edge of the clock after that start trigger so my first sample would be AA. You would then need to have software split that single sample into two samples, A and A.
Does that make sense?
Message Edited by Ryan M on 11-17-2006 10:13 AM