Transient Line and Load Regulation

[anandahs]

Hi,

I have to test the transient response of an LDO. I have to give 600mV peak to peak input in 10us. How can I configure the timing in the power supply. I am using Agilent E363X power supply. The same is the case with transient load response. I have to change load from 100uA to 150mA in 10us. Please help me how to set these timing parameters. I am using Agilent 606X load.

Please help

Thanks

Ananda H S

[johnsold]

Ananda H S,

Can the instruments even do what you want? The E363x specifications show voltage programming speed in the tens to hundreds of milliseconds (not microseconds) and a transient response time of < 50 us for load current changes.  I did not look up the load but it may have similar specs.

If you need to have microsecond variations, you will probably need to design your own circuits.

Lynn

[anandahs]

Lynn

Thanks for the reply. Since am very new to this am not clear about whether I can do that transient line regulation using Agilent E363X. So am asking is it possible to do that using agilent E363X? I found one more supply Chroma in which I can set the time but am not sure how to do it.

One more doubt is eventhough I configure the time between two voltage levels will the labview exection time affects my timing?

Thanks

Ananda H S

[johnsold]

Ananda H S,

All I know about the Agilent devices is what I read from their data sheet. The reason I commented is that typically power supplies, even high end programmable ones, tend to respond in milleseconds rather than microseconds.  They typically have large capacitance and large power devices and slow analog feedback loops regulating the outputs.  The other factor is that programming via GPIB or RS-232 often takes 10s of milliseconds or longer on many instruments.

If you look at the literature on high speed testing, you will find that often a DC power source is followed by an inductively coupled AC perturbing signal.  This allows the device under test to be driven by a rapidly changing input or output stimulus without requiring that the power source be capable of a fast response.  The source of the perturbing signal does not need to supply the entire power for the test device, only the transient power.

Lynn