08-01-2007 10:33 AM
08-01-2007 10:43 AM
08-01-2007 10:46 AM
08-02-2007 09:45 AM
Hi,
Currently there isn't a way to import a WGL file. What do you want to do with it? Is it possible to use any other format?
Stephanie
08-02-2007 12:57 PM
Hello,
I would like to automaticaly generate the test patterns from this file to run the test scan on a custom IC.
TetraMax makes a tool :
Scan Converter is a low cost option for converting scan tests, Serial or Parallel, into tester formatted patterns and timing. The tool accepts either WGL or STIL formats which are the most widespread vector formats produced by today's leading ATPG tools, such as Mentor Graphics' FastScan, Synopsys' TetraMAX and similar.
Scan Converter creates all files needed to load and run different testers, such as Agilent, Teradyne and LTX.
waveform embedded
signal
"A" : input;
"B" : input;
"Z" : output;
end
timeplate "_default_WFT_" period 100ns
"A" := input [0ps:S];
"B" := input [0ps:S];
"Z" := output [0ps:X, 40ns:Q'edge];
end
pattern group_ALL ("A", "B", "Z")
{ non_scan_test }
{ pattern 0 }
{ capture }
vector("_default_WFT_") := [ 1 1 X ];
vector("_default_WFT_") := [ 1 1 1 ];
{ pattern 1 }
{ capture }
vector("_default_WFT_") := [ 0 1 X ];
vector("_default_WFT_") := [ 0 1 0 ];
{ pattern 2 }
{ capture }
Read netlist embedded.v -delete
Run build embedded
Set drc -nofile
Run drc
Set pattern external func_pat.wgl
Thanks!
11-02-2007 12:29 AM
11-20-2007 10:11 AM
11-20-2007 11:15 PM
11-21-2007 09:18 AM
01-22-2010 02:13 PM
Hey guys,
National Instruments has been working with Test System Strategies Incorporated (TSSI), an NI Alliance Partner to develop a new pattern conversion tool called the TSSI TD-Scan for National Instruments to enable engineers to import WGL and STIL vector formats into PXI.
The software coverts digital test vectors from either WGL or STIL to work directly with NI 654x and NI 655x digital devices. The software tool is available from TSSI and is included as a 30-day evaluation package with NI high-speed digital I/O PXI hardware. You can also request an evaluation version at the link above.
To learn more about the tool, check out the following whitepaper and webcast:
Using TD-Scan with National Instruments High Speed Digital Devices (NI 654x and 655x)
Importing WGL/STIL files with the TSSI TD-Scan for National Instruments (webcast)
Thanks,
Scott Savage
Semiconductor Market Development Manager - Semiconductor Test
National Instruments