Subject: Custom Data Communication and Pattern Match Issues Between LabVIEW, Digital Pattern Editor, and PXI
Hello NI Community,
I'm working on a custom UART communication setup involving LabVIEW, Digital Pattern Editor, and PXI hardware (NI PXIe-6570). I have a few questions regarding test case implementation and signal matching between STM32 and the DPE.
1. How can I test custom data (e.g., strings, numbers, special characters) between LabVIEW and Digital Pattern Editor without using a precompiled pattern file?
I want to manually send and receive various types of data (ASCII strings, numbers, special characters) through LabVIEW and analyze them using the Digital Pattern Editor, but without creating a complete pattern file in advance. Is there a recommended workflow or example for dynamically testing such custom data?
2. I’m sending character "A" from STM32 to PXI, but the expected start bit in the pattern file is LOW, while STM32 sends it as HIGH — causing an error. Why is this happening?
I defined the UART pattern for receiving data in DPE with the assumption that the start bit is LOW (as per UART standard), but when I send "A" from STM32, the Digital Pattern Editor raises a miscompare, showing the first bit as HIGH. Is this due to signal polarity mismatch, voltage levels, or something else?
3. Do I need to use a compare strobe when reading data from STM32 into the Digital Pattern Editor?
When capturing and validating incoming UART data from STM32 using the PXIe-6570, should I explicitly define a compare strobe in my pattern or configuration for proper synchronization and validation of the received bits?
Anup Wankhede
